制程能力及檢測參數(shù) |
||
NO |
ITEM |
Technical capabilities |
1 |
層次 |
1-40 layers |
2 |
最大尺寸 |
2000mm*610mm |
79"*24" |
||
3 |
板厚 |
0.2mm--10.0mm |
0.008"--0.4" |
||
4 |
銅厚 |
17um-420um |
0.5OZ--12OZ |
||
5 |
最小線寬/線距 |
0.05mm/0.05mm |
0.003"/0.0026" |
||
6 |
最小孔徑 |
0.1mm |
0.006" |
||
7 |
PTH孔孔徑差 |
±0.05mm |
±0.002" |
||
8 |
NPTH孔孔徑差 |
+0/-0.05mm |
+0/-0.002" |
||
9 |
孔位公差 |
±0.05mm |
±0.002" |
||
10 |
V-CUT角度 |
20-90度 |
20DEG-90DEG |
||
11 |
最小V-CUT板厚 |
0.4mm |
0.016" |
||
12 |
外型公差 |
±0.1mm |
±0.004" |
||
13 |
最小盲/埋孔 |
0.1mm |
0.06" |
||
14 |
塞孔 |
0.2mm--0.6mm |
0.008"--0.024" |
||
15 |
最小BGA |
0.2mm |
0.008" |
||
16 |
材質(zhì) |
FR4,鋁基,高Tg,無鹵,羅杰斯,鐵氟龍,ISOLA |
FR4,Aluminium,High Tg,Halogen-free,Rogers,Teflon,ISOLA |
||
17 |
表面處理 |
無鉛噴錫,沉金,沉銀,沉錫,OSP,電厚金,沉金+OSP,噴錫+金手指 |
LF-HAL,ENIG,ImAg,ImSn,OSP,Gold plating,ENIG+OSP,HAL+G/F |
||
18 |
翹曲度 |
≤0.75% |
19 |
通斷測試 |
50--300V |
20 |
可焊性試驗 |
245±5℃,3sec Wetting area least95% |
21 |
熱沖擊試驗 |
288±5℃,10sec,3cycles |
22 |
離子污染測試 |
Pb,Hg,Cd,Cr(VI),PBB,PBDE六項均小等于1000ppm |
Pb,Hg,Cd,Cr(VI),PBB,PBDE six items are less than 1000ppm |
||
23 |
附著力測試 |
260℃+/-5, 10S,3times |